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Title:
Scanning acoustic microscopy investigation of engineered flip-chip delamination
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Twenty Sixth IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.00CH37146) [0-7803-6482-1] Hutt, David
yr:2000
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Proceeding: Electronics Manufacturing Technology Symposium, IEEE/CHMT(CPMT) International [1089-8190]
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