SFX SFX Services for this record
Language
Title: A methodology for developing local smart diagnostic models using expert knowledge
Source:

Industrial Informatics (INDIN), 2015 IEEE 13th International Conference on [1-4799-6650-9; 1-4799-6649-5]

yr:2015
Collapse list of basic services Basic (Passwords for e-Journals can be found here )

Full Text

Full text available via IEEE Electronic Library (IEL) Conference Proceedings GO
Authentication: Login to VPN for off campus access.